The EM section has a Scanning Electron Microscope (SEM) fitted with an Energy Dispersive Spectrometer (EDS) for elemental analysis. High resolution Secondary Electron Imaging, Backscattered Electron Imaging, X-Ray microanalysis and X-Ray mapping are all possible. In addition, the SEM is equipped with a cryogenic stage allowing for the preservation of fluid phases in the samples, and analysis in situ if necessary.
Instrumentation available:
- Carl Zeiss SIGMA VP Analytical Field Emission Scanning Electron Microscope
- Bruker QUANTAX 400 Energy Dispersive X-ray Spectrometer with Xflash 5030 Silicon Drift Detector
- Quorum Technologies PP2000T cryo-SEM preparation system
- Leitz Polarizing microscope equipped with a Spot ‘Insight’ digital camera (Diagnostic Instruments, Inc.)